Sinuo Testing Equipment Co. , Limited
Sinuo Testing Equipment Co., Limited
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High Energy Pendulum Hammer Impact Test Apparatus for Charging Station
Complied Standards & Clauses
It conforms to standards:
IEC60068-2-75:2014 “Environment testing for electric and electronic products Part2: Test methods -Test Eh: Hammer tests IDT”
IEC62262:2002 “Degrees of protection provided by enclosures for electrical equipment against external mechanical impacts (IK code)”
It is required by IEC60335-2-25 clause 22.119.3, etc.
Product Overview
This test apparatus is used for the impact resistance test of household and similar electronic and electrical products and their accessories such as plugs and sockets and wall mounted mounting boxes, screw glands, covers, switches, lamps, etc., to assess the safety performance and strength level of the products.
The high-energy pendulum impact test device adopts a trolley structure, can move
around left and right, the height of the upper and lower impact points is adjustable
through the screw guide, the impact angle is adjustable from 0 to 90°.
The striking element is free released at a certain height through a 1 m pendulum tube, impact the specimen at the lowest point in the vertical direction, after the conversion of gravitational potential energy to kinetic energy, to achieve the purpose of impact test on the sample.
Technical Parameters
| Technical Parameters | |
| Striking Elements (Energy/J) | Standard: 2J (IK07), 5J (IK08) 10J(IK09), 20J(IK10) |
| Equivalent Mass kg | 500g,1.7kg ,5 kg,5 kg are for 2J,5J,10J,20J, please refer to following table 1 |
| Striking Elements Material | Steel |
| Pendulum Tube | Length 1000㎜,outer diameter 15.9 mm, wall thickness 1.5 mm steel pipe |
| Impact Point | Can be electrically adjustable up and down, stroke: 0-1500mm |
| Height of Fall | 0-500mm, scale display The height can be adjusted by handwheel |
| Lifting | Electrical mode |
| Impact element release method | Electromagnetic release |
| Base plate | Thicken load-bearing steel base plate |
| Way of moving | With casters, it can be moved to the position of the impact point of the sample |
| Anti-secondary impact function | Yes |
Details
